Point measurement ellipsometer SE-101

SE-101

Specifications

  SE-101
Measurement
Repeatability Film thickness: 0.1nm, Refractive index: 0.001
Measurement speed 0.05 seconds/1 points
Light source Laser diode(resonate wavelength 636nm)
Measurement spot about 1×1mm
Incidence angle 70 degrees
Chassis
Stage size Maximum 4 inch-capable manual stage
Size 250 W×175 D×218.3 H [mm]
Weight about 4kg
Other
Interface GigE(camera signal)
Power source From AC100 to 240V
Software SE-View
Accessories Notebook computer, manual, software CD, standard sample
※Product specifications may be changed without prior notice.