Thin Film Thickness Measurement, Laser Ellipsometer

Ellipsometer is a device that can measure the thickness / refractive index of a thin film noncontactly and nondestructively. Among them, our company's ellipsometer can measure the thickness / refractive index distribution of thin films as high speed, high definition, high accuracy .

The high-Speed Laser Ellipsometer at a New Level

ME-210
ME-210
SE-101
SE-101