Before purchase

Q

How is the light stability of photonic crystal beam shapers?

The durability of 8 kW/cm2 (wavelength: 1064 nm) and 10 kW/cm2 (wavelength: 355 nm) have been confirmed with CW lasers.

Q

Do you have any demonstration products of photonic crystal optical elements?

Demo samples of axisymmetric polarizers with an effective diameter of Φ7mm for 405nm or 532nm wavelengths are available.

Q

Do you have any off-the-shelf or standard photonic crystal optical elements? And what about beam shapers?

Axisymmetric polarizers are available as standard products at wavelengths of 405 nm, 532 nm, and 1064 nm. Beam shapers are not available as standard products, but are custom-made.

Q

Does a wavelength influence the manufacturability of photonic crystal optical elements?

Shorter wavelengths make a material selection and pattern design more difficult.

Q

How is the transmittance of photonic crystal optical elements

It is about 98%.

Q

What are the characteristics of photonic crystal beam shapers in comparison to DOE? Also, what is the diffraction efficiency?

The efficiency is equivalent to that of a DOE with a very fine relief structure of steps. However, unlike DOE, there is no discontinuous structure, so it has an advantage in terms of less scattering. Since the surface planarization of the device is also possible, the surface can be easily cleaned, which is difficult with DOE.

Q

Are photonic crystal optical elements available for unpolarized light?

We can propose elements for the non-polarized light incidence.

Before purchase

Q

What is the difference between the PA and WPA series?

The polarization image sensor is different: PA is suited for low phase difference and WPA for high phase difference measurements.
PA is used for evaluation of glass and acrylics, while WPA is used for evaluation of molded plastic products, films, and high stress.

Q

Is it possible to measure stress with the PA system?

No. It measures retardation, not stress.

However, the stress can be obtained on the user-side by noticing that the retardation is the result of the stress multiplied by the thickness multiplied by the photo-elastic constant.

The data processing function (software option) has a stress calculation module, for customers who need it.

It is not possible to guarantee calculated values, as the device has no knowledge about the real shape of the device under test, other that thickness information provided by the user.

Q

Is it possible to measure the refractive index profile?

No. The system measures a difference of refractive indices (i.e., birefringence ordinary index and extraordinary index), by looking at the change of polarization, not the absolute value of the refractive index.

Q

Why does the WPA series measure at 3 wavelengths?

Different phase differences are measured for each of the three measurement wavelengths. From this difference, it is possible to calculate large phase differences that cannot be determined at a single wavelength.

Q

How much is the resolution?

The field of vision range is changed by the height of measurement head unit as it moves up and down.

Thus, the resolution is determined by the height of measurement head unit, as the number of data points is constant, i.e., equal to 2464 pixels in the horizontal direction for PA and equal to 384 pixels in the horizontal direction for WPA. The resolution is obtained by dividing the field of vision range by the number of data points.

Q

Is it possible to measure semi-transparent materials?

It depends on the level of transparency. Please check the system by evaluating a known sample. Measurements may differ due to the transparency. Please thoroughly understand the system before trusting measurements.

Q

In the measurement environment, is a darkroom required?

保証はしておりませんが、クリーンルームでの使用実績は多数ございます。

Q

Is it possible to combine with automatic stages to perform automatic measurement flow?

Yes. PA/WPA system can be controlled by an external program using our remote-control function (software option), that can be purchased if needed.

Q

In the measurement environment, is a darkroom required?

It is not necessary but is recommended as reflections of indoor light could affect measurements.
Optional “Shading cover for PA/WPA” are available for some models.

Q

Is it possible to customize the PA/WPA system?

Yes. Please contact Photonic Lattice to discuss.

Q

How can a material be checked for birefringence?

Sandwich the material between two polarizing films, and then turn one film relative to the other.

If brightness or color tone change by turning, the material has birefringence.

Q

Is it possible to measure retardation directed towards the vertical axis?

No, it is not possible.

Q

Is it possible to measure the dependence of retardation on the angle of incidence?

No, it is not possible.

Q

Is it possible to measure frosted glass?

It depends on the level of transparency. Please check the system by evaluating a known sample. Measurements may differ due to the transparency. Please thoroughly understand the system before trusting measurements.

Q

Is it possible to measure red-colored materials?

近赤外波長で測定できる機種がリリースされました。1度サンプル測定、デモなどでお試しください。

Q

Is it possible to change the objective lens freely?

No. The system should be calibrated for each objective lens at Photonic Lattice. Please do not attempt to modify by yourself.

Q

Is it possible to use other light sources by removing measurement head unit?

Our suggestion is to use the MT type.
The measurement head unit is removable, but please contact us before attempting to remove the measurement head by yourself.

After purchase

Q

How can I set the baseline?

Firstly, place the device under test on the stage to confirm the field of vision range and the focus. After focusing, remove the object from the stage and then press the “Baseline” button.

Q

What is the time interval before resetting to baseline?

It is desirable to reset to the baseline just before each single measurement, if possible.

It is possible that atmospheric temperature changes over time can affect the baseline data.

Q

What is “measurement accuracy”?

The main contributor of noise with the PA system is random noise associated with the CCD sensor.

It can be reduced by increasing acquisition time.

The amount of data to be acquired changes when the “measurement accuracy” condition changes in the software.

The measurement time therefore becomes longer as a larger amount of data is acquired in higher accuracy modes.

Q

What is recommended when changing objective lens?

The system is calibrated for each objective lens delivered with the equipment. Thus, lens condition must be updated into the software by the user each time the lens is replaced.

Q

The field of vision range is changed by a height change. The baseline should be reset because polarization condition will not be the same, resulting in measurement error.

The field of vision range is changed by a height change. The baseline should be reset because polarization condition will not be the same, resulting in measurement error.

Q

Is it possible to measure just after starting?

Yes, however it is desirable to wait for approximately 30 minutes after starting to allow for stabilization of the system.

Q

When measuring a sample with a curved surface (such as a lens), I get a phase difference distribution that does not follow when I rotate the sample. Is this being measured?

It is thought that the circular polarizing film on the light source side is affected by oblique incidence. There is an option to reduce this effect, so please consider this option.

Q

How to evaluate phenomena that change in a shorter time than the measurement time?

Real-time analysis is available as an option. This function allows numerical analysis of phenomena that change in seconds.

Q

Is the measurement environment affected?

Yes, the room temperature should be kept at a constant level.
Also, when measuring low phase differences, it is important to allow time for the sample to acclimate to the temperature.

Before purchase

Q

Is it possible to measure the thickness of a multilayer film?

Yes. However, only two parameters can be measured at once, and only if the thickness and refractive index of all other layers are known.

Q

Is it possible to measure the film thickness on a transparent substrate?

The ME-210-T system can measure thin film if the substrate is thicker than 0.5mm.
Not possible for SE series.

Q

What is the spatial resolving power of ME?

In high-definition mode, it is possible to obtain data intervals down to 5.5 μm.

However, please consider the resolving power of the optical system to be around 20 μm.

Q

Is it possible to change the measurement wavelength?

Modifying the measurement wavelength requires customization and will be considered on a case-by-case basis. Please inquire with customer support.

Q

Can the measurement equipment be used in a cleanroom?

Yes. Please inquire with customer support.

Q

Is it possible to use the equipment as a spectroscopic ellipsometer?

No. It can be used only as a single wavelength ellipsometer.

Q

Is it possible to combine with a loader device?

Yes, it is a matter of customization. Please contact customer support.

Q

What is the measurement speed of ME?

The maximum speed is 20,000 points per minute in standard mode, and more in high-definition mode.

Q

What is the maximum possible measurement area of ME?

Standard model: up to 8 inches.
Upgraded model: up to 12 inches.

Q

Is it possible to buy a measurement head alone for the SE series?

Full equipment must be purchased first. It is used as a calibration set when purchasing additional measurement heads.

Before purchase

Q

What can this camera observe and evaluate?

CRYSTA can visualize transparent materials’ internal stress and orientation structure in real-time.
Please see the evaluation examples on the Case Studies page.

Before purchase

Q

What can this camera observe and evaluate?

Infrared high-speed cameras can be used to observe and evaluate high-speed temperature measurement, CO2 gas visualization, and temperature analysis of welding.
Please see the evaluation examples on the Case Studies page.

Before purchase

Q

What can this camera observe and evaluate?

Its high-speed real-time capabilities allow the evaluation of fast-moving dynamic phenomena.
Please see the evaluation examples on the Case Studies page.