We have started to sell new 5 products.

WPA-100-H
—–wide-range 2D birefringence measurement system corresponding to high range phase difference
This system can measure phase difference distribution over 10,000 nm.

PA-110-t
—–2D birefringence measurement system with a XY stage
This system can measure a 8 inch wafer at once.

ME-210-T
—–high-speed mapping ellipsometer corresponding to transparent substrates
This system can measure a thin film on a transparent substrate such as glasses

SE-102
—–compact-size and reasonable ellispometer
This compact-size ellipsometer has minimum functions and is reasonable.

PI-micro
—–microscope attachment birefringence observation camera